In the framework of the Project INERA an automatic spectroscopic ellipsometer model M2000D has been delivered at the Institute of Solid State Physics, Bulgarian Academy of Sciences.
This unique apparatus, yet the first in Bulgaria, will be used for optical characterization of thin dielectric, semiconductor, metal and organic layers and multilayer structures and liquid samples.
Presentation of the capabilities of the new equipment was made on November 27, 2014 at Inter Expo Hotel during the meeting “Nanophotonics: New Optic Equipment in ISSP, BAS” with the representatives of leading companies in the field of industrial optics
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