ADVANCED TECHNOLOGIES AND METHODS
FOR CHARACTERIZATION OF
MULTIFUNCTIONAL THIN FILMS AND
NANOSTRUCTURES
21 – 22 July, 2015
Hotel EXPO, Sofia, Bulgaria
PROGRAMME
21 July 2015
| 10:00 – 10:10 | Openning by prof. Prof. Kiril Blagoev |
| 10:10 – 11:00 | Darya Vladikova and Z. Stoynov ”Impedance Spectroscopy – Methodology and Applications |
| 11:00 – 11:20 | Coffee-break |
| 11:20 – 12:10 | Zdravko Stoynov, E. Mladenova, D. Levi and D. Vladikova ”Permittivity Spectroscopy – an Insight into Materials Properties” |
| 12:10 – 13:00 | Catalin Luculescu Nanostructured surface-enhanced Raman scattering substrates obtained by low energy plasmas” |
| 13:00 – 14:00 | Lunch |
| 14:00 – 16:00 | Visit to the corresponding facilities at the Institute of Solid State Physics (M-2000D and BIO-LOGIC SP-200) |
22 July 2015
| 10:00 – 10:50 | Hermine Stroescu ”Application of Spectroscopic Ellipsometry for multifunctional thin films and nanostructures characterization” |
| 10:50 – 11:10 | Coffee-break |
| 11:10 – 12:00 | Jerome Leclercq Thermal Programmed Desorption techniques for thin films characterization” |
| 12:00 – 12:50 | Catalin Luculescu ”Single-Walled Carbon Nanotubes synthesis and processing” |
| 13:00 – 14:00 | Lunch |
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